X-ray structure analysis allows the identification of crystalline materials via X-ray diffraction (XRD) on the crystal lattice. The position and intensity of the maxima in the diffraction pattern depends on the arrangement of the atoms in the crystal lattice and is therefore specific to a material.

X-ray structure analysis is usually carried out on fine powders, is therefore also called powder diffractometry and is used to:

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• Identification of crystalline solids and their quantification

• Determination of the crystal modifications of a compound (phase analysis)

• Measurement of lattice parameters, crystallite sizes and degree of crystallinity

• Characterization of hydroxyapatite with respect to crystallinity, phase purity and Ca/P ratio according to ISO 13779-3