Surface analysis and microscopy
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Electrons
microscopy
(REM-EDX)
The scanning electron microscope (SEM) is a device for imaging surface structures. It produces images with high resolution and depth of field. In addition, the distribution of different materials can be visualized. Energy dispersive X-ray spectroscopy (EDX) can also be used to analyze the local elemental composition of the various sample areas.
application areas
Structure and composition of components
Damage analysis
Stains and dirt
Analysis of competitive products
surfaces
Analytics
(ESCA)
Electron spectroscopy for chemical analysis (also XPS) analyzes (semiquantitatively) the elemental composition of the uppermost nanometers (10-15 atomic layers) of solids.
The method also provides information about the bonding states of the elements. The removal of the layers by sputtering allows the measurement of the depth distribution of elements (depth profile).
application areas
Liability
Wetting problems
Paint peeling
Surface and interface characterization
Corrosion protection
Reactivity of catalysts
Raster force
microscopy
(AFM)
AFM (Atomic Force Microscopy) is a microscopic technique in which the surface of a sample is scanned with a fine needle. This provides complete three-dimensional information about the topography of the surface. With suitable samples, atomic resolution is achieved. The measurements can be carried out in air or in liquids.
application areas
Analysis of microroughness
Measuring the smallest height differences
Visualization of the local distribution of chemical information on the surface
molecule
Spectroscopy (IR/Raman/
UV-Vis)
In molecular spectroscopy, the incoming light is absorbed or scattered. This is characteristic of certain molecular fragments. The recorded spectra show specific bands for certain molecular components, which can be used to identify organic materials in particular.
application areas
Analysis of organic components
Polymer characterization
Damage analysis
Stains and dirt
Analysis of competitive products
Roughness
Measurement
Using a phertometer, the surface of the sample is scanned with a needle of defined geometry and standardized roughness parameters are calculated.
application areas
profile
Waviness and roughness
medium roughness
Bearing ratio
Roughness depth
